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Langer EMV S603/S750 Probe Set 1Ω/150Ω Conducted RF Measurement acc. IEC 61967-4
$ 4218.19
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Test and Measurement
Multimeters
Counters & Timers
Power Quality Analyzers
Thermometers
Other Test Equipment
RF & Microwave
Spectrum Analyzers
Other Microwave Equipment
Calibration Equipment
RTD/Thermocou?ple Calibrators
Voltage Calibrators
Pressure Calibrators
Other Calibration Equipment
Process Calibrator
Standard Resistors
Industrial, Process, & Control
Multifunction Calibrator
Multimeter
Clamp Meter
MegOhmMeter
Thermometer
Power Quality Analyzer
HART
Power Systems and Substation
Insulation Tester
Ohmmeter (DLRO)
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Langer EMV S603/S750 Probe Set 1Ω/150Ω Conducted RF Measurement acc. IEC 61967-4
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PRODUCT DESCRIPTION
This item is a new
Langer EMV S603/S750 Probe Set 1Ω/150Ω Conducted RF Measurement according to IEC 61967-4.
Please allow
2 - 3
weeks lead time for this product to arrive.
This set consists of:
1xS603, 1 Ohm, RF Current Probe, 0 kHz - 3 GHz acc. to IEC 61967-4
1xS750, 150 Ohm, RF Voltage Probe, 100 kHz - 3 GHz acc. to IEC 61967-4
1xSMA-SMA 1 m, SMA-SMA Measuring Cable
This item comes with a 12 Month (One Year) warranty
from the
manufacturer.
We Calibrate your Test Equipment! Contact us for more information on Calibration by
visiting
stratatek.com/calibration
This probe set is used to measure conducted emissions 1 Ohm/150 Ohm with the direct coupling method on IC pins. The S603 probe is used for current measurement and the S750 probe is used for voltage measurement.
The measurements with the S603/S750 ensure a high repeatability and comparability of the measurements. The measurements can be performed with the ChipScan-ESA software. The measurement results of all measured pins are saved with the help of the software. It allows systematically and quickly comparison and analysis of the measured data.
The
S603 probe
is a 1 Ω-probe for direct measurement of high frequency (RF) current at IC pins. It is used to measure at supply pins (Vdd / Vss) and signal pins. The S603 1 Ohm RF current probe has a pin contact with which every IC pin can be separately contacted and measured
By means of an SMA - connection the probe can be easily connected to the IC test boards. The S603 probe is designed for measuring on ground lines (Vss).
The
S750 probe
is a RF-Voltmeter for conducted measurement of high frequency voltage on IC pins. The S750 complies with the 150 Ω coupling network according to IEC 61967-4 up to a frequency of 3 GHz.
By means of a SMA connection, the S750 probe can be easily connected to the IC test board. The S750 probe is designed for measuring on signal lines.
Any questions or clarifications, feel free to ask
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Import duties, taxes, and charges are not included in the item price or shipping cost. These charges are the buyer's responsibility. Please check with your country's customs office to determine what these additional costs will be prior to bidding or buying. For more information of clarification, please ask.
Will ship worldwide. We make our best efforts to get you the best shipping prices. Contact us for other international rates and we will be pleased to give you a quote.
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Sales to within Canada are subject to 5% GST. Ontario sales subject to 13% HST.
About Us
Stratatek Test & Measurement is a source for new and used test equipment, measurement equipment, and industrial process & control calibrators and meters. We calibrate in-house, traceable to NIST.
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All used equipment comes with a minimum 90 Day Warranty. Your unit is guaranteed to be fully functional or money will be refunded upon return. New products typically carry a 1 Year Warranty.
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